JPS6322541Y2 - - Google Patents

Info

Publication number
JPS6322541Y2
JPS6322541Y2 JP1981113863U JP11386381U JPS6322541Y2 JP S6322541 Y2 JPS6322541 Y2 JP S6322541Y2 JP 1981113863 U JP1981113863 U JP 1981113863U JP 11386381 U JP11386381 U JP 11386381U JP S6322541 Y2 JPS6322541 Y2 JP S6322541Y2
Authority
JP
Japan
Prior art keywords
alignment
aligning
plane
springs
spring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1981113863U
Other languages
English (en)
Japanese (ja)
Other versions
JPS5819273U (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP11386381U priority Critical patent/JPS5819273U/ja
Priority to EP82303546A priority patent/EP0069592B1/en
Priority to DE8282303546T priority patent/DE3263256D1/de
Priority to IE1652/82A priority patent/IE53232B1/en
Publication of JPS5819273U publication Critical patent/JPS5819273U/ja
Priority to US06/673,203 priority patent/US4604572A/en
Application granted granted Critical
Publication of JPS6322541Y2 publication Critical patent/JPS6322541Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP11386381U 1981-07-08 1981-07-31 位置合せ機構 Granted JPS5819273U (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP11386381U JPS5819273U (ja) 1981-07-31 1981-07-31 位置合せ機構
EP82303546A EP0069592B1 (en) 1981-07-08 1982-07-06 Device for testing semiconductor devices at a high temperature
DE8282303546T DE3263256D1 (en) 1981-07-08 1982-07-06 Device for testing semiconductor devices at a high temperature
IE1652/82A IE53232B1 (en) 1981-07-08 1982-07-08 Device for testing semiconductor devices at a high temperature
US06/673,203 US4604572A (en) 1981-07-08 1984-11-19 Device for testing semiconductor devices at a high temperature

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11386381U JPS5819273U (ja) 1981-07-31 1981-07-31 位置合せ機構

Publications (2)

Publication Number Publication Date
JPS5819273U JPS5819273U (ja) 1983-02-05
JPS6322541Y2 true JPS6322541Y2 (en]) 1988-06-21

Family

ID=29908151

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11386381U Granted JPS5819273U (ja) 1981-07-08 1981-07-31 位置合せ機構

Country Status (1)

Country Link
JP (1) JPS5819273U (en])

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2541191Y2 (ja) * 1991-03-22 1997-07-09 安藤電気株式会社 フローティングガイド付きハンドラ用キャリア

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6143239Y2 (en]) * 1979-11-02 1986-12-06

Also Published As

Publication number Publication date
JPS5819273U (ja) 1983-02-05

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